The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 02, 2002

Filed:

Jun. 22, 1999
Applicant:
Inventors:

Christopher John Sine, Palo Alto, CA (US);

Alper Ilkbahar, Santa Cruz, CA (US);

Scott W. Murray, San Jose, CA (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03K 1/716 ; G06F 1/26 ;
U.S. Cl.
CPC ...
H03K 1/716 ; G06F 1/26 ;
Abstract

A method and apparatus for providing controllable compensation factors to a compensated driver circuit which may be used to perform testing of the structural integrity of the compensated driver circuit. One disclosed apparatus includes a compensated driver circuit having a number of subcomponents. At least one compensation factor, which may be provided by a compensation circuit, controls which of the subcomponents to enable. An additional circuit is coupled to provide controllable values for the at least one compensation factor.


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