The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 15, 2002

Filed:

Jul. 14, 1999
Applicant:
Inventor:

Gary L. Anderson, St. Ann, MO (US);

Assignee:

MEMC Electronic Materials, Inc., St. Peters, MO (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B44C 1/22 ; H01L 2/1302 ;
U.S. Cl.
CPC ...
B44C 1/22 ; H01L 2/1302 ;
Abstract

A method of fabricating a semiconductor wafer is disclosed. The method reduces the number of processing steps and produces a low cost semiconductor wafer having external gettering. The method includes slicing the wafer from a single silicon crystal ingot and etching the wafer to clean impurities and residue from slicing. Thereafter, the wafer is double side polished which creates damage on both the front and back surfaces. The damage on the front surface is then removed in a subsequent plasma assisted chemical etching step and touch polishing operation which significantly improves the flatness of the wafer. The damage on the back surface created by the double side polishing remains and getters defects from the front surface and bulk regions of the wafer.


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