The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 15, 2002

Filed:

Jan. 11, 2000
Applicant:
Inventors:

Yoshikuni Tateyama, Hiratsuka, JP;

Katsumi Yamamoto, Hachioji, JP;

Hiroshi Kato, Tokuyama, JP;

Kazuhiko Hayashi, Shinnanyo, JP;

Hiroyuki Kono, Shiki, JP;

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B24D 3/02 ;
U.S. Cl.
CPC ...
B24D 3/02 ;
Abstract

Provided is a high purity polishing slurry which provides a material to be polished with a high scratch resistance and has a high polishing efficiency and which less contaminates the material to be polished. The polishing slurry comprises water and silica particles dispersed in water, wherein the above silica particles have an average primary particle size of 50 to 300 nm and a refractive index of 1.41 to 1.44 and are synthesized in a liquid phase and produced without passing through a drying step; and the K value is 5×10 mol/m or more. Further, a polishing process for a semiconductor wafer using the above polishing slurry is provided.


Find Patent Forward Citations

Tateyama, Yoshikuni. (2002). Polishing slurry and polishing method (U.S. Patent No. 6338744). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6338744

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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