The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 04, 2001

Filed:

Jul. 01, 1998
Applicant:
Inventors:

Chia Shiung Tsai, Hsin-Chu, TW;

Hun-Jan Tao, Hsin-Chu, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 2/14763 ;
U.S. Cl.
CPC ...
H01L 2/14763 ;
Abstract

A new method of forming a dual damascene interconnect is disclosed for manufacturing semiconductor substrates. A contact/via hole is first formed in a first dielectric layer formed over a substructure of a substrate having devices formed therein and/or metal layers formed thereon. The contact/via hole is filled with a protective material prior to forming a second dielectric layer. Conductive line opening is formed in the second dielectric layer and over the contact/via hole having the protective material in it. The protective material protects the edge of the contact/via hole from damage due to the second etching of the conductive line opening. Thus, a dual damascene structure is disclosed wherein the integrity of the edge of the contact/via hole is preserved, avoiding any reliability problems in the semiconductor product.


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