The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 28, 2001

Filed:

Oct. 05, 1998
Applicant:
Inventors:

Paul F. Bodenweber, Kingston, NY (US);

Ralph R. Comulada, Rock Tavern, NY (US);

Mukta S. Farooq, Hopewell Junction, NY (US);

Charles J. Hendricks, Wappingers Falls, NY (US);

Philo B. Hodge, Roxbury, CT (US);

Vincent P. Peterson, Poughkeepsie, NY (US);

Terence W. Spoor, Marlboro, NY (US);

Kathleen M. Wiley, Wappingers Falls, NY (US);

Yuet-Ying Yu, Hopewell Junction, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 3/102 ;
U.S. Cl.
CPC ...
G01R 3/102 ;
Abstract

Disclosed is an interposer and test structure for making contact between a substrate and a test bed. One embodiment of the interposer has a floating, rigid conductive element in a nonconductive body which makes temporary contact between the test bed and the substrate. In another embodiment of the invention, the interposer includes two layers of material, in which one layer includes pogo pins for contacting the substrate and the other layer includes pads for contacting the test bed. The pogo pins are on a grid spacing corresponding to that of the substrate input/output pads while the interposer pads are on a grid spacing corresponding to that of the pogo pin contactors of the test bed.


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