The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 14, 2001

Filed:

Jan. 08, 1999
Applicant:
Inventor:

Chia-Chieh Yu, Taipei, TW;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 2/144 ;
U.S. Cl.
CPC ...
H01L 2/144 ;
Abstract

An improved method of forming a via on a semiconductor substrate forms a conductive line thereon and then forms an inter-metal dielectric layer over the conductive line. A patterned photoresist layer is formed on the inter-metal dielectric layer. A portion of the inter-metal dielectric layer is removed to expose the conductive line using the photoresist layer as a mask to form a via hole, wherein the via hole is subsequently used to form a via. A high density plasma process is performed to remove the photoresist layer. The photoresist layer remaining on the substrate is removed with a solvent.


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