The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 01, 2001

Filed:

Feb. 10, 2000
Applicant:
Inventors:

Paul Kwok Keung Ho, Singapore, SG;

Mei Sheng Zhou, Singapore, SG;

Subhash Gupta, Singapore, SG;

Chockalingam Ramasamy, Singapore, SG;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 2/144 ;
U.S. Cl.
CPC ...
H01L 2/144 ;
Abstract

A new method of depositing a copper seed layer in the manufacture of an integrated circuit device has been achieved. The copper seed layer is thin and conformal and well-suited for subsequent electroless plating of copper. A dielectric layer, which may comprise a stack of dielectric material, is provided overlying a semiconductor substrate. The dielectric layer patterned to form vias and trenches for planned dual damascene interconnects. A barrier layer comprising tantalum, titanium, or tungsten is deposited overlying the dielectric layer to line the vias and trenches. A copper seed layer is deposited overlying the barrier layer by the reaction of CuF2 vapor with the barrier layer, and the integrated circuit is completed.


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