The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 03, 2001

Filed:

May. 17, 1999
Applicant:
Inventors:

Chu-Wei Hu, Taichung, TW;

Jiue Wen Weng, Hsin-Chu, TW;

Ruey Yun Shiue, Hsin-Chu, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 2/14763 ;
U.S. Cl.
CPC ...
H01L 2/14763 ;
Abstract

A process for forming a dual damascene opening, in a composite insulator layer, comprised of an overlying, wide diameter opening, used to accommodate a metal interconnect structure, and comprised of an underlying, narrow diameter opening, used to accommodate a metal via structure, has been developed. The process features the use of conventional photolithographic and anisotropic dry etching procedures, used to create an initial dual damascene opening, in the composite insulator layer. The subsequent formation of insulator spacers, on the vertical sides of the initial dual damascene opening, however, results in a final dual damascene opening, featuring a diameter smaller than the diameter displayed with the initial dual damascene opening.


Find Patent Forward Citations

Hu, Chu-Wei. (2001). Dual damascene process flow for a deep sub-micron technology (U.S. Patent No. 6211069). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6211069

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…