The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 03, 2001

Filed:

Jul. 26, 1999
Applicant:
Inventors:

Chuan-Fu Wang, Taipei Hsien, TW;

Horng-Nan Chern, Tainan Hsien, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 2/1336 ;
U.S. Cl.
CPC ...
H01L 2/1336 ;
Abstract

A method of forming a borderless contact is described. An ion implantation process and a thermal process are performed on a device isolation structure to form a silicon nitride layer therein. During a process of forming a borderless contact window, the silicon nitride layer can serve as an etching stop layer to protect the device isolation structure from overetching. As a result, no recess is formed, and leakage current is avoided.


Find Patent Forward Citations

Loading…