The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 27, 2001

Filed:

May. 21, 1999
Applicant:
Inventors:

Ming-Shing Chen, Feng-Shan, TW;

Akira Mao, Tainan, TW;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 2/13205 ; H01L 2/14763 ;
U.S. Cl.
CPC ...
H01L 2/13205 ; H01L 2/14763 ;
Abstract

A method of fabricating a semiconductor device is described. A conductive layer is formed on a substrate. A spacer is formed on a sidewall of the conductive layer. A thin metallic layer is formed over the substrate. An ion implantation step is performed. A first seeding layer is formed between the first metallic layer and the conductive layer. A second seeding layer is formed between the first metallic layer and the substrate. A second metallic layer is formed over the substrate. An annealing step is performed to form a self-aligned silicide layer on the conductive layer. The first metallic layer and the second metallic layer that do not react are removed.


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