The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 30, 2001

Filed:

May. 24, 1999
Applicant:
Inventors:

Eun-hee Shin, Seoul, KR;

Sung-bum Cho, Kyungki-do, KR;

Baik-soon Choi, Kyungki-do, KR;

Young-koo Lee, Kyungki-do, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 2/100 ; H05H 1/00 ;
U.S. Cl.
CPC ...
H01L 2/100 ; H05H 1/00 ;
Abstract

A dielectric window of a dry etching apparatus for manufacturing semiconductor devices is shaped so that areas of high density plasma in the etching apparatus correspond to portions of the dielectric window further away from the wafer and areas of lower density plasma correspond to portions of the dielectric window closer to the wafer. For example, the dielectric window may be curve inwards at its center in a concave-shape.

Published as:
KR20000012948A; JP2000082700A; US6179955B1; KR100297552B1; TW509980B; JP3676620B2;

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