The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 23, 2001
Filed:
Mar. 09, 1998
Applicant:
Inventors:
Hajime Sato, Kure, JP;
Kiyohiro Nakata, Kure, JP;
Chikashi Hamano, Kure, JP;
Toshihiko Mishima, Kure, JP;
Tohru Fujimitsu, Higashihiroshima, JP;
Assignee:
Mitutoyo Corporation, Kawasaki, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 3/18 ;
U.S. Cl.
CPC ...
G01B 3/18 ;
Abstract
A micrometer includes a main body holding an anvil at one end portion and a spindle at the other end portion through an inner sleeve is formed with a frame which is made by placing a pair of frame elements, which are formed by bending metal plates, one upon the other to reduce weight while ensuring rigidity. The outside of the frame is covered with resin to reduce the weight, enhance the rigidity, and prevent the influence caused by the heat of hand when the frame is gripped.