The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 19, 2000

Filed:

Jul. 12, 1999
Applicant:
Inventors:

Janmye Sung, Hsinchu, TW;

Nicky Lu, Hsinchu, TW;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L / ;
U.S. Cl.
CPC ...
257306 ; 438253 ;
Abstract

A process for fabricating a capacitor over bitline, DRAM device, using a self-aligned contact opening, through, and between the bitline structures, and featuring the formation of insulator spacers, on the sidewall of the bitline structures, formed after the opening of the self-aligned contact, has been developed. The self-aligned contact opening, located through the bitline structures, allows an increase in DRAM cell density to be achieved. The formation of insulator spacers, on the sidewall of the bitline structures, formed after the opening of the self-aligned contact, in a silicon oxide layer, allows silicon oxide to be used as the spacer material, thus resulting in capacitance decrease when compared to counterparts fabricated using silicon nitride spacers.


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