The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 28, 2000
Filed:
Dec. 04, 1998
Shih-Ming Lan, Hsinchu, TW;
United Silicon Incorporated, Hsinchu, TW;
Abstract
A method for fabricating a dual damascene structure is provided. The method contains providing a substrate, which has a patterned metal layer on it. A first liner oxide layer, a first seed layer are sequentially formed over the substrate. The first seed layer is patterned to form a first opening above the patterned metal layer to expose the first liner oxide layer. A first dielectric layer is formed over the substrate. The first dielectric layer includes a first porous dielectric layer on the first seed layer, and a first normal dielectric layer on the exposed portion of the first liner oxide layer. A first cap layer is formed over the first dielectric layer, and is planarized. An etching stop layer with a second opening above the first opening to expose the first cap layer is formed on the first cap layer. With the same formation mechanism, a second liner oxide layer, a second seed layer with a third opening above the second opening, a second porous dielectric layer, a second cap layer are formed over the substrate. A mask layer is formed over the second cap layer. Patterning the above layers forms a damascene opening in the first normal dielectric layer and the second normal dielectric layer. Filling the dual damascene opening with metallic material forms a dual damascene structure.