The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 14, 2000
Filed:
Nov. 06, 1998
Amit Chowdhary, Sunnyvale, CA (US);
Sudhakar S Kale, San Jose, CA (US);
Phani K Saripella, Santa Clara, CA (US);
Naresh K Sehgal, Santa Clara, CA (US);
Rajesh K Gupta, Irvine, CA (US);
Intel Corporation, Santa Clara, CA (US);
Abstract
In some embodiments, the invention includes a method of regularity extraction including generating a set of templates for a circuit through computer automated operations on a description of the circuit. The method also includes covering the circuit with instances of a subset of the templates. In some embodiments, the set of templates includes single-principal output templates, where a single-principal output templates is a template in which all outputs of the template are in the transitive fanin of a particular output of the template. The set of templates may also include tree templates. In some embodiments, the set of templates is a complete set of templates given certain assumptions including that the set of templates include all maximal templates of involved classes of templates and a template is not generated through permuting gate inputs. In some embodiments, the covering of the circuit involves selecting one of the set of templates and meeting certain criteria and deleting all nodes in instances of the selected template. The covering may further include deleting the templates in the set of templates other than the selected templates and regenerating a new set of templates from the remaining uncovered circuit.