The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 03, 2000

Filed:

Nov. 24, 1997
Applicant:
Inventors:

Egbert Graeve, Los Altos, CA (US);

Burnell G West, Fremont, CA (US);

Assignee:

Schlumberger Technologies, Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
714 39 ; 714739 ; 714 32 ;
Abstract

In a tester for testing circuits, apparatus and methods for acquiring waveform data from a circuit under test. While a test program is being run by the tester, waveform acquisition strobe events are generated for application to a terminal of a circuit under test. A measurement circuit receives the waveform acquisition strobe events and applies each strobe event to the terminal of the circuit and generates result signals representing the result of applying the strobe events to the terminal. A capture memory receives and stores result signals generated by the measurement circuit.


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