The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 22, 2000
Filed:
Mar. 25, 1998
Applicant:
Inventor:
Jeffrey C Kalb, Jr, Phoenix, AZ (US);
Assignee:
Intel Corporation, Santa Clara, CA (US);
Primary Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324765 ; 324501 ; 324752 ;
Abstract
A method for detecting defects in a CMOS integrated circuit. In one embodiment, an integrated circuit is exercised to a first cycle. IDDQ testing is then performed on the integrated circuit. Next, the integrated circuit is irradiated with for example ultraviolet radiation, which in one embodiment sets floating gates to an intermediate operating value. Next, IDDQ testing is performed again and any differences in IDDQ between the two IDDQ test measurements may be attributed to floating gate defects in the integrated circuit.