The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 08, 2000
Filed:
May. 29, 1998
Thomas N Marieb, San Francisco, CA (US);
Krishna Seshan, San Jose, CA (US);
Donald L Scharfetter, Los Altos, CA (US);
Intel Corporation, Santa Clara, CA (US);
Abstract
A wafer testing rig includes a stand, a first contact component, a second contact component and a biasing device. The first contact component is mounted to the stand. The second contact component is mounted to the stand for movement towards and away from the first contact component. The first and second contact components are shaped so that a wafer, when located between the contact components, is deflected into a dome shape when the second contact component is moved towards the first contact component. The biasing device is operable to move the second contact component towards and away from the first contact component. An electrical tester is provided to test the wafer.