The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 01, 2000
Filed:
Dec. 05, 1997
Applicant:
Inventors:
John Caywood, Sunnyvale, CA (US);
David Y Lepejian, Palo Alto, CA (US);
Assignee:
Heuristic Physics Laboratories, San Jose, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
716 21 ; 716 19 ;
Abstract
A method for managing stepper operations required during the manufacturing of an integrated circuit die having at least one known defect, as determined by inspection, comprises the steps of determining, based upon an analysis of the connectivity and defect information relating to the die having at least one known defect a probability of failure to each at least one known defect and eliminating from stepper operations any die having at least one fatal defect.