The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 25, 2000

Filed:

Sep. 04, 1998
Applicant:
Inventors:

Dong-ho Ahn, Suwon, KR;

Sung-eui Kim, Suwon, KR;

Yu-gyun Shin, Seoul, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L / ;
U.S. Cl.
CPC ...
438439 ; 438426 ; 438431 ; 438435 ; 438444 ; 438445 ; 438446 ;
Abstract

An isolation method in the fabrication process of a semiconductor device is provided. The method forms an oxide layer as a buffer layer for reducing stress through chemical vapor deposition (CVD). By the method, a first pad oxide layer and a silicon nitride layer are formed on a semiconductor substrate, and then an silicon nitride layer pattern is formed by patterning, and undercuts are formed in the first pad oxide layer pattern. Subsequently, a second pad oxide layer is formed on the entire surface of the semiconductor substrate through CVD, and then spacers are formed on the sidewalls of both the patterned first pad oxide layer and silicon nitride layer and a field oxide layer is formed through thermal oxidation. Alternatively, a silicon layer is deposited without the spacers to form the field oxide layer. The second pad oxide layer is a buffer layer for buffering stress during formation of the field oxide layer.


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