The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 11, 2000
Filed:
May. 17, 1999
Hongchin Lin, Hsinchu, TW;
Shyh-Chyi Wong, Hsinchu, TW;
Chien-Zhi Chen, Hsinchu, TW;
Chia-Hsiang Sha, Hsinchu, TW;
Winbond Electronics Corp., Hsinchu, TW;
Abstract
A circuit and a method for measuring the read operation delay on DRAM bit lines are disclosed. The circuit comprises a plurality of circuit blocks connected in series, each having a 1-bit DRAM cell. The output of the DRAM cell in each circuit block is connected to the word line of the DRAM cell of the next circuit block through inverters, so the read operation in the DRAM cell of the next circuit block is triggered. The total delay between the word line at the first circuit block and the output of the last circuit block can be measured on the oscilloscope. The delay for every 1-bit DRAM cell is equal to the total delay divided by the number of circuit blocks.