The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 11, 2000
Filed:
Jun. 04, 1998
Taiwan Semiconductor Manufacturing Company, Ltd., Hsin Chu, TW;
Abstract
An apparatus and a method for measuring eccentricity between two circular members which are attached together is provided. The apparatus includes a vernier measuring device of a main scale and a vernier scale, and a mounting block having a V-shaped notch in a top surface for receiving a circular member and for mounting the main scale of the vernier measuring device securely to the block. The novel apparatus and method can be used to not only making direct measurement of the eccentricity between the two centers, they may also be used to read directly the number of pulses required for making adjustment to a robot arm when the divisions on the main scale and the vernier scale are specifically designed for such purpose. The method can be carried out by first aligning the zero setting on the main scale with the center of the first circular member, and then aligning the zero setting on the vernier scale with the center of the second circular member, and then reading the distance between the two zero settings for determining the eccentricity.