The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 27, 2000

Filed:

Sep. 29, 1997
Applicant:
Inventors:

Takaaki Murakami, Hyogo, JP;

Kenji Yasumura, Hyogo, JP;

Toshiyuki Oishi, Hyogo, JP;

Katsuomi Shiozawa, Hyogo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
39550035 ; 39550024 ; 39550025 ; 39550034 ; 257391 ; 257392 ; 257219 ; 438207 ; 438218 ; 438225 ;
Abstract

In a trench isolation structure having active regions at a main surface of a silicon substrate isolated by providing a gate electrode on an insulation film formed in a trench with a gate oxide film thereunder, the insulation film has a vertical cross section configuration wherein the carrier concentration of the active region at the proximity of the upper edge corner of the trench becomes lower than the carrier concentration at the center of the active region in a state where a predetermined bias voltage is applied to the gate electrode. According to this structure, electric field concentration at the edge of the trench isolation can be relaxed and generation of an inverse narrow channel effect suppressed. Therefore, the subthreshold characteristics can be improved.


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Murakami, Takaaki. (2000). Semiconductor device including trench isolation structure and a method (U.S. Patent No. 6081662). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6081662

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