The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 29, 2000
Filed:
Dec. 26, 1996
Applicant:
Inventors:
Praveen Parvathala, Phoenix, AZ (US);
Fred Gruner, Palo Alto, CA (US);
Assignee:
Intel Corporation, Santa Clara, CA (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
714726 ; 365201 ;
Abstract
A method and apparatus for providing a scan cell having a first input coupled to receive a data, a data output and a scan output. The scan cell being capable of transferring data to said scan output in response to a first scan clock and a second scan clock without requiring any timing-sensitive control signals.
Parvathala, Praveen. (2000). Method and apparatus for performing scan testing (U.S. Patent No. 6032278). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6032278
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile