The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 30, 1999
Filed:
May. 07, 1998
Applicant:
Inventors:
Ching-Long Tsai, Taipei, TW;
Yunn-Ming Tsou, Chupei, TW;
Assignee:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B24B / ;
U.S. Cl.
CPC ...
451 28 ; 451 31 ; 451 29 ; 451 41 ;
Abstract
A method for preparing a specimen block for TEM analysis that uses target point breaking of an original specimen block into two separate blocks with one block containing the point targeted for analysis. Hence, over-polishing can be avoided and polishing time is saved. Furthermore, polishing is carried out by sandwiching the specimen block between sacrificial blocks supported by polish-resistant blocks below. With the polish-resistant blocks acting as a polishing stop layer, a fixed thickness instead of variable thickness will remain after the specimen is polished.