The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 09, 1999

Filed:

Nov. 24, 1997
Applicant:
Inventors:

Jung-min Park, Seoul, KR;

Jae-gun Park, Kyungki-do, KR;

Gon-sub Lee, Kyungki-do, KR;

Gi-jung Kim, Kyungki-do, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C25D / ; C25D / ; C25D / ; B32B / ;
U.S. Cl.
CPC ...
205118 ; 205 81 ; 205120 ; 205123 ; 205135 ; 205157 ; 205149 ; 205210 ; 427140 ; 427309 ; 427282 ; 438928 ; 438687 ;
Abstract

Methods of treating wafers for analyzing defects present therein comprise providing wafers having front side surfaces comprising defective portions and a back side surfaces opposite thereto; and decorating the defective portion of the front side of the wafer with copper.


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