The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 27, 1999
Filed:
Jul. 24, 1997
Kishio Hidaka, Hitachioota, JP;
Takeo Kamino, Hitachinaka, JP;
Toshie Yaguchi, Minori-machi, JP;
Katsuhisa Usami, Hitachi, JP;
Takashi Aoyama, Toukai-mura, JP;
Shigeyoshi Nakamura, Hitachinaka, JP;
Ryo Hiraga, Hitachioota, JP;
Masahiro Tomita, Hitachinaka, JP;
Hitachi, Ltd., Tokyo, JP;
Hitachi Instruments Engineering Co. Ltd., Hitachinaka, JP;
Abstract
A method of operating an electron microscope under a high temperature and the electron microscope are provided. The electron microscope can stably set and efficiently heat a sample to observe and measure high temperature physical properties such as phase transformation, phase transition and the like required for development of a heat resistant material. In the method of operating the electron microscope and the electron microscope, a sample to be observed is set so as to position at a central hole of a double spiral flat filament, the detachable heating stage is fixed to the heating holder using screws of a pivot, and the heating stage is tilted by vertical movement of a crank-shaped arm. The heating stage and the arm are insulated from each other by an insulating body, and current from a power source is conducted by a conductor wire to heat the filament.