The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 30, 1999
Filed:
Sep. 27, 1996
Applicant:
Inventor:
Jeffrey C Kalb, Jr, Pheonix, AZ (US);
Assignee:
Intel Corporation, Santa Clara, CA (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324765 ; 324763 ;
Abstract
A method for detecting defect in a semiconductor device using IDDQ testing techniques that are not dependent upon the background leakage current for defect resolution. One embodiment of the present invention uses device sampling, i.e. creates a small sample of a device that is representative of the whole device, such that the ratio of the quiescent current of the device to the quiescent current of the sample exhibits a linear relationship to the ratio of the component count of the device to the component count of the sample.