The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 01, 1998

Filed:

Feb. 20, 1996
Applicant:
Inventors:

Fwu-Iuan Hshieh, Saratoga, CA (US);

True-Lon Lin, Cupertino, CA (US);

Assignee:

MagePower Semiconductor Corp., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L / ; H01L / ; H01L / ;
U.S. Cl.
CPC ...
257341 ; 257401 ; 257342 ;
Abstract

A MOSFET device formed in a semiconductor chip with a top surface and a bottom surface. The MOSFET device includes a drain region doped with impurities of a first conductivity type, formed near the bottom surface. The MOSFET device further includes a plurality of vertical cells wherein each of the vertical cell includes a vertical pn-junction zone region includes a lower-outer body region, doped with impurities of a second conductivity type, formed on top of the drain region. The pn-junction region further includes a source region, doped with impurities of the first conductivity type, formed on top of the lower-outer body region, the lower-outer body region surrounding the source region and extending to the top surface thus defining a cell area for the cell. The vertical cell further includes a source contact formed on the top surface contacting the source region. The MOSFET further includes a plurality of gates. Each gate is formed on the top surface as a poly layer extending from an area near a boundary of the source region and the lower-outer body region of one of the cells to a neighboring cell, the gate includes a thin insulative bottom layer for insulating from the vertical cell, the gate is provided for applying a voltage thereon for controlling a charge state of a channel underneath each of the gates thus controlling a vertical current from the source contact to the drain region. The MOSFET device further includes a plurality of open stripes whereby a width of the channel is increased and a JFET resistance for each of the vertical cells is decreased.


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