The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 27, 1998
Filed:
Sep. 29, 1997
Applicant:
Inventors:
Chih-Jen Lin, Lawrenceville, NJ (US);
Kwang-Ting Cheng, Santa Barbara, CA (US);
Assignee:
Lucent Technologies Inc., Murray Hill, NJ (US);
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
39518306 ;
Abstract
Test points (20, 24) placed at selected nodes (16) within a circuit (10) based on a cost function that accounts for (a) the global improvement in testability and (b) the penalty in circuit performance associated with propagation delays attributable to such test points. By accounting for both the global impact on testability and circuit performance degradation, the cost function maximizes fault coverage while achieving nearly minimal impairment of circuit performance.
Lin, Chih-Jen. (1998). Method for inserting test points for full-and-partial-scan built-in (U.S. Patent No. 5828828). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5828828
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile