The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 25, 1998

Filed:

Jul. 08, 1997
Applicant:
Inventors:

Mohsen Alavi, Beaverton, OR (US);

Tahir Ghani, Beaverton, OR (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L / ; H01L / ;
U.S. Cl.
CPC ...
257371 ; 257335 ; 257338 ; 257339 ; 257368 ; 257370 ; 257401 ; 438228 ; 438231 ; 438233 ;
Abstract

A method and an apparatus for forming a transistor suitable for a high voltage circuit. In one embodiment, the transistor is formed without adding any steps to an existing state-of-the-art CMOS process. A well is implanted into a portion of a substrate such that the well has a higher doping concentration than the substrate. A first diffusion region is then implanted into the substrate such that at least a portion of the first diffusion is disposed within the well. In addition, a second diffusion is implanted into the substrate separated from the well such that the second diffusion region is disposed entirely outside the well. A channel region is disposed between the first and second regions and gate is disposed over the channel region to form the high voltage transistor. Since the second diffusion region is disposed entirely outside the well in the lower doped substrate, a higher junction breakdown voltage is realized. Furthermore, with the transistor layout described herein having at least a portion of the first diffusion region disposed within the well, adequate device isolation is also realized.


Find Patent Forward Citations

Loading…