The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 07, 1998
Filed:
Apr. 30, 1996
Henry Seiwatz, Wayne, NJ (US);
Carl A Listl, New Hyde Park, NY (US);
J Michael Donahue, Oakland, NJ (US);
David F Lewis, Monroe, CT (US);
ISP Investments Inc., Wilmington, DE (US);
Abstract
In a method for manufacturing a calibrated radiation dosimeter, a layer of radiation sensitive material is applied to a substrate, the radiation sensitive material having an optical density which varies in accordance with a degree of radiation exposure. A pre-exposure optical density of the layer of radiation sensitive material is optically measured and subsequently the layer of radiation sensitive material is exposed to a known dose of radiation. Thereafter, a post-exposure optical density of the layer of radiation sensitive material is optically measured. Using at least the pre-exposure optical density, the post-exposure optical density, and the known dose of radiation, one computes mathematical parameters defining a predetermined mathematical function. The computed mathematical parameters are applied in encoded form to the substrate (e.g., printed in bar code form on the substrate or a holder card).