The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 23, 1998

Filed:

Jul. 16, 1996
Applicant:
Inventors:

Edward Darko Babich, Chappaqua, NY (US);

Karen Elizabeth Petrillo, Mahopac, NY (US);

John Patrick Simons, Cold Spring, NY (US);

David Earle Seeger, Congers, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F / ;
U.S. Cl.
CPC ...
4302701 ; 430905 ; 430907 ; 430914 ; 430915 ; 430919 ; 430920 ; 430922 ; 430923 ; 430924 ; 522-9 ; 522 16 ; 522 17 ; 522 25 ; 522 26 ; 522 27 ; 522 28 ; 522 30 ; 522 18 ; 522 20 ; 522 21 ; 522 12 ;
Abstract

The sensitivity of a photoresist to actinic light is improved by the addition of certain dyes. The photoresist includes a polymer matrix, a photosensitive acid generator and at least one compound selected from the group consisting of dyes containing at least one heterosulphur atom such as 2,2.sup.1,5.sup.1,2'-terthiophene and its derivatives; thianthrene and its derivatives, and 4,6-diphenylthieno(3,4-d)-1,3-dioxol-2-one-5,5-dioxide; phenylsulfone and its derivatives; and 4,5-diphenyl-1,3-dioxol-2-one; 3,4-bis(acetoxymethyl)furan; chelidonic acid and its derivatives; and 5,7,12,14-pentacenetetrone. Resist images on a substrate are formed from the compositions.


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