The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 21, 1998
Filed:
Sep. 27, 1996
Applicant:
Inventor:
Jeffrey C Kalb, Jr, Phoenix, AZ (US);
Assignee:
Intel Corporation, , US;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ; G01N / ;
U.S. Cl.
CPC ...
324765 ; 324760 ; 324522 ; 324537 ; 437-8 ; 374-4 ;
Abstract
A method for detecting defects in a semiconductor device using an IDDQ testing technique that is not dependent upon the background leakage current for defect resolution. One embodiment of the present invention utilizes the dependence of the background leakage current on temperature and/or voltage to zero out the background leakage in determining the defect current of a device.