The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 24, 1998

Filed:

Jul. 22, 1996
Applicant:
Inventors:

Yoshitaka Tadaki, Hanno, JP;

Jun Murata, Kunitachi, JP;

Katsuo Yuhara, Ibaraki-ken, JP;

Yuji Ezaki, Tsuchiura, JP;

Michio Tanaka, Ome, JP;

Michio Nishimura, Tokorozawa, JP;

Kazuhiko Saitoh, Ibaraki-ken, JP;

Takatoshi Kakizaki, Tsukuba, JP;

Shinya Nishio, Musashimurayama, JP;

Takeshi Sakai, Ome, JP;

Songsu Cho, Ibaraki-ken, JP;

Assignees:

Hitachi, Ltd., Tokyo, JP;

Texas Instruments Incorporated, Dallas, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C / ;
U.S. Cl.
CPC ...
365 51 ; 257296 ; 257300 ;
Abstract

A DRAM has memory cells provided at crossing points between word line conductors and bit line conductors. Each memory cell has a cell selection transistor and an information storage capacitor arranged over the bit line conductors. Unit active regions are defined in a main surface of a semiconductor substrate by a field isolation pattern. The field isolation pattern has a controlled length of extension of bird's beaks so that channel formation regions in each unit active region has almost no stepped portion to provide the cell selection transistors with a stabilized threshold voltage.


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