The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 10, 1998

Filed:

Sep. 19, 1996
Applicant:
Inventors:

Eiichi Iwanami, Tateyama, JP;

Toshio Wada, Tateyama, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C / ;
U.S. Cl.
CPC ...
365201 ; 36518905 ;
Abstract

Four I/O pads are allocated to a group from one end to the other. A test circuit is provided for each of the groups. The four I/O pads are only connected to a test data terminal of an IC tester while the rest of the I/O pads are not connected. The test circuit comprises: a test mode detection circuit for detecting the device shifting to the test mode; a test mode writing circuit for writing data inputted from one of the I/O pads into four memory cells; a coincidence circuit for determining whether the data read from the four memory cells coincide with each other; and a data output circuit for outputting the result to the I/O pad.


Find Patent Forward Citations

Iwanami, Eiichi. (1998). Semiconductor memory device with testing function (U.S. Patent No. 5717643). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5717643

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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