The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 10, 1997

Filed:

Nov. 07, 1995
Applicant:
Inventors:

J Michael Donahue, Oakland, NJ (US);

David F Lewis, Monroe, CT (US);

Henry Seiwatz, Wayne, NJ (US);

Carl A Listl, New Hyde Park, NY (US);

Assignee:

ISP Investments Inc., Wilmington, DE (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J / ;
U.S. Cl.
CPC ...
2504741 ; 2504731 ; 2504721 ;
Abstract

A method for determining a level of exposure to radiation utilizes a radiation dosimeter comprising a substrate provided with a radiation sensitive layer or patch having an optical density which varies in accordance with the degree of radiation exposure. In addition, the substrate is provided with optically readable coding which identifies encoded mathematical parameters for enabling an automated calculation of dosage from a detected post-exposure optical density of the radiation sensitive material. The method comprises the step of optically measuring the optical density of the layer of radiation sensitive material prior to exposure thereof to radiation. In addition, the coding on the dosimeter substrate is scanned to automatically determine the encoded mathematical parameters. The method further comprises the steps of exposing the radiation sensitive layer to radiation and optically measuring a post-exposure optical density of the layer of radiation sensitive material. Subsequently, from the pre-exposure optical density, the post-exposure optical density, and the mathematical parameters and in accordance with a predetermined mathematical algorithm, a quantitative radiation dose to which the layer of radiation sensitive material was exposed is automatically computed. Preferably, the computed quantitative radiation dose is automatically indicated on a display. Each dosimeter may be provided with a unique identification code encoded in the bar coding on the dosimeter substrate, to enable memory storage of pre-exposure optical densities for multiple dosimeters. A look-up table may be stored in memory for enabling correction of computed optical densities where the post-exposure densities are measured at different times intervals after exposure.


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