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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 5631868 B1

PDFFull Text
Date of Patent:
May. 20, 1997

Filed:

Nov. 28, 1995

Method and apparatus for testing redundant word and bit lines in a

Applicant:
Inventors:

Luigi Termullo, Jr, Colchester, VT (US);

Marcel J Robillard, Williston, VT (US);

James J Covino, Essex, VT (US);

Stuart J Hall, Underhill Center, VT (US);

Assignee:

International Business Machines Corporation, Armonk, NY (US);

Attorneys:

Whitham, Curtis, Whitham & McGinn

Walter, Jr.; Howard J.

Primary Examiner:

Joseph A Popek

Int. Cl.
CPC ...
G11C / ; G01R / ;
U.S. Cl.
CPC ...
365200 ; 365201 ; 371 102 ; 371 225 ;
Abstract

A method and apparatus for evaluating a memory having memory elements and redundant memory elements for redundancy replacement. The redundant memory elements are tested to determine the number of good redundant memory elements. The memory elements are also tested to determine whether there are any failing memory elements. It is then determined whether a sufficient number of good redundant elements are available to replace the failing memory elements. If an insufficient number of redundant memory elements are available, the testing is stopped.

Find Patent Forward Citations

Termullo, Jr, Luigi. (1997). Method and apparatus for testing redundant word and bit lines in a (U.S. Patent No. 5631868). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5631868

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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