The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 11, 1997
Filed:
Feb. 28, 1995
Hidehito Takayama, Chigasaki, JP;
Matsuomi Nishimura, Ohmiya, JP;
Kazumi Tanaka, Yokohama, JP;
Toshikazu Ohnishi, Machida, JP;
Takeshi Miyazaki, Ebina, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
In a method for measuring a specified component in a specimen by reacting the specimen with a first reagent formed by binding a substance active to the specified component, with carrier particles and a second reagent formed by labelling a substance active to the specified component with a first label, and measuring the substances in the complexes obtained in the reaction, there is disclosed a method featured by labelling the carrier particles with a second label different from the first label, and detecting the second label and then the first label utilizing the detection of the second label as a trigger. This method enables a highly precise measurement without the influence of noise components in the detection of specified trace components in the specimen, utilizing an antigen-antibody reaction or a nucleic acid hybridization.