The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 07, 1997

Filed:

Dec. 21, 1995
Applicant:
Inventors:

Junji Fujikawa, Tokyo-to, JP;

Yukio Iimura, Tokyo-to, JP;

Masahiro Takahashi, Tokyo-to, JP;

Takashi Nishimoto, Tokyo-to, JP;

Hiroyuki Matsui, Tokyo-to, JP;

Masanobu Fujita, Tokyo-to, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02F / ; G03F / ;
U.S. Cl.
CPC ...
349110 ; 430-5 ; 349105 ;
Abstract

A chromium blank for forming a black matrix-screen to be used as a color filter for a liquid crystal display is formed by forming at least a first antireflection film, a second antireflection film and a screening film sequentially in that order on one major surface of a transparent substrate. Each of the first and the second antireflection film is a semitransparent film formed of a chromium compound or a chromium mixture, containing chromium as a principal component, and the screening film is formed of chromium, a chromium compound containing chromium as a principal component. The transparent substrate, the first antireflection film, the second antireflection film and the screening film meet an inequality: n.sub.s <n.sub.1 <n.sub.2 <n.sub.3, where n.sub.s is the refractive index of the transparent substrate, n.sub.1 is the real part of the complex index of refraction of the first antireflection film, n.sub.2 is the real part of the complex index of refraction of the second antireflection film, and n.sub.3 is the real part of the complex index of refraction of the screening film, in the substantially entire visible wavelength range.


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