The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 19, 1995

Filed:

May. 13, 1993
Applicant:
Inventors:

Burnell West, Fremont, CA (US);

Egbert Graeve, Los Altos, CA (US);

Assignee:

Schlumberger Technologies, Inc., San Jose, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
3241581 ; 324 731 ;
Abstract

A number of local sequencers, one for each pin of the device under test is disclosed. Each local sequencer is provided with a global clock, a global time zero signal indicating the clock edge for referencing the start of a test, and a period vernier indicating an offset from the clock for the start of the test period. Each local sequencer uses this information to generate its own test events referenced to the test period with individual calibration delays factored in locally. Each local sequencer is individually programmable so that different sequencers can provide different numbers of events during the same test period.


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