The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 21, 1995

Filed:

Jun. 03, 1994
Applicant:
Inventors:

Fwu-Iuan Hshieh, Saratoga, CA (US);

Sze-Hon Kwan, Sunnyvale, CA (US);

Mike F Chang, Cupertino, CA (US);

Yueh-Se Ho, Sunnyvale, CA (US);

Jan Van Der Linde, Saratoga, CA (US);

King Owyang, Atherton, CA (US);

Assignee:

Siliconix Incorporated, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L / ; H01L / ;
U.S. Cl.
CPC ...
257331 ; 257332 ; 257341 ; 257401 ; 257520 ; 257622 ; 437 48 ; 437 66 ; 437 67 ; 437 78 ; 437 79 ; 437225 ; 437913 ;
Abstract

A trenched DMOS transistor has improved device performance and production yield. During fabrication the cell trench corners, i.e. the areas where two trenches intersect, are covered on the principal surface of the integrated circuit substrate with a blocking photoresist layer during the source region implant step in order to prevent (block) a channel from forming in these corner areas. Punch-through is thereby eliminated and reliability improved, while source/drain on-resistance is only slightly increased. The blocking of the trench corners creates a cutout structure at each trench corner, whereby the source region does not extend to the trench corner, but instead the underlying oppositely-doped body region extends to the trench corner.


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