The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 29, 1995

Filed:

Feb. 25, 1994
Applicant:
Inventors:

Masaru Hori, Aichi, JP;

Hiroyuki Yano, Yokohama, JP;

Keiji Horioka, Kawasaki, JP;

Hisataka Hayashi, Urayasu, JP;

Sadayuki Jimbo, Yokohama, JP;

Haruo Okano, Tokyo, JP;

Kazuhiro Tomioka, Tokyo, JP;

Yasuhiro Ito, Yokohama, JP;

Haruki Mori, Yokohama, JP;

Assignee:

Kabushiki Kaisha Toshiba, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L / ; C03C / ; B44C / ; C23F / ;
U.S. Cl.
CPC ...
1566431 ; 252 791 ; 437228 ;
Abstract

A dry-etching method comprising the steps of forming carbon film on a substrate to be etched, forming a resist pattern on said carbon thin film, selectively etching said carbon film using said resist pattern as a mask by a plasma of a gas mixture of a gas containing fluorine atoms and a gas containing oxygen atoms which are mixed at an atomic ratio of fluorine to oxygen of 198:1 to 1:2 so as to form a carbon film pattern, and selectively etching said substrate to be etched using said carbon film pattern as a mask or said resist pattern and said carbon film pattern as masks.


Find Patent Forward Citations

Loading…