The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 17, 1994

Filed:

Nov. 12, 1991
Applicant:
Inventors:

Sung-Wei Lin, Houston, TX (US);

John F Schreck, Houston, TX (US);

Phat C Truong, Houston, TX (US);

David J McElroy, Lubbock, TX (US);

Harvey J Stiegler, Houston, TX (US);

Benjamin H Ashmore, Jr, Houston, TX (US);

Manzur Gill, Arcola, TX (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G11C / ; G11C / ;
U.S. Cl.
CPC ...
36523006 ; 365185 ; 36518909 ;
Abstract

A wordline-decode system of a nonvolatile memory array is split into three smaller decoding subsystems (a Read-Mode Decode Subsystem, a Program/Erase-Mode Decode Subsystem and a Segment-Select Decoder Subsystem). The segmented array has small bitline capacitance and requires few input connections to each decoding subsystem. The Read-Mode Decoder circuitry and the Program/Erase-Mode Decoder circuitry are separated, allowing the Read-Mode Decoder circuitry to be desired for high speed access and allowing the Program/Erase-Mode Decoder circuitry to be desired for high voltage operation. Buried-bitline segment-select transistors reduce the area required for those transistors. Erasing may be performed after first checking each row of a segment to determine the present of any over-erased cells. Programming may be performed by allowing the common source-column lines of the selected segment to float and by placing preselected voltages on the appropriate wordline and drain-column line.


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