The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 05, 1994
Filed:
Nov. 18, 1991
Howard L Heck, Endicott, NY (US);
John S Kresge, Binghamton, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A two-stage Monte Carlo method of tolerancing components of an assembly is provided. Statistical measures of component features are not time invariant, but change over a production run. That is, the mean value of component feature measures and the standard distribution of the component feature measures about the time dependent mean are not invariant over a production run, but shift with time and throughput. According to the invention, these 'shifted' or 'adjusted' parameters are utilized in a Monte Carlo simulation to determine discrete values for the individual points of each output distribution, x(i), y(i), z(i). The individual points of the output distributions, x(i), y(i), z(i), are combined in a second Monte Carlo simulation step for individual assembly final fit F(x(i), y(i), z(i)). The statistics of the individual assembly final fits are then compared to manufacturing specifications.