The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 01, 1993
Filed:
Jan. 03, 1991
Junichi Kanai, Hanyu, JP;
Advantest Corporation, Tokyo, JP;
Abstract
In a semiconductor memory tester in which a test pattern from a pattern generator is applied to a plurality of memory devices installed on a test head and their outputs are each logically compared by a logical comparator with an expected value for each pin, there are provided a plurality of OR circuits each of which obtains the OR of the results of logical comparisons corresponding to predetermined plural pins of each memory device. A plurality of multiplexers, each of which is supplied with the results of logical comparisons for corresponding output pins of the plurality of memory devices and a different one of the plurality of OR outputs, are provided for each group of corresponding output pins and each selectively output any one of the plurality of results of logical comparisons and the OR input thereto in accordance with a select signal. The outputs of these multiplexers are distributed to and stored in a plurality of fail memories.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile