The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 05, 1993

Filed:

Dec. 13, 1991
Applicant:
Inventors:

Dudley A Chance, Newton, CT (US);

Evan E Davidson, Hopewell Junction, NY (US);

Timothy R Dinger, Croton-on-Hudson, NY (US);

David B Goland, Bedford Hills, NY (US);

David P Lapotin, Carmel, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L / ; H01L / ;
U.S. Cl.
CPC ...
257678 ; 361412 ; 361414 ; 361401 ; 257684 ; 257698 ; 257701 ; 257723 ; 257731 ;
Abstract

A semiconductor package is described for supporting and interconnecting semiconductor chips, each chip having contact lands on a contact surface, the package also including a substrate with a contact surface. An interposer module is disposed between at least one chip's contact surface and the substrate's contact surface. The interposer module has first and second opposed surfaces and a first plurality of contact locations positioned on its first surface which mate with a chip's contact land. A second plurality of contact locations on the interposer modules second surface are positioned to mate with contact lands on the substrate. A set of conductive vias are positioned within the interposer module and connect the first plurality of contact locations with a first subset of the second plurality of contact locations. A distributed capacitance layer is positioned within the interposer and is adjacent to its first surface. Adjacent to the second surface are X and Y lines which can be used to make engineering change interconnections.


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