The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 17, 1989

Filed:

Mar. 14, 1988
Applicant:
Inventors:

Dennis L Goodwin, Tempe, AZ (US);

Mark R Hawkins, Mesa, AZ (US);

Wayne L Johnson, Phoenix, AZ (US);

Aage Olsen, Chandler, AZ (US);

McDonald Robinson, Paradise Valley, AZ (US);

Assignee:

Epsilon Limited Partnership, Tempe, AZ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L / ; H01L / ; C03B / ; B44C / ;
U.S. Cl.
CPC ...
156646 ; 156612 ; 156613 ; 156650 ; 156654 ; 156657 ; 156662 ; 4272552 ; 437 85 ;
Abstract

The present invention relates to a high throughput single crystal epitaxial deposition process which achieves increased uniformity, both wafer to wafer and across the wafer surface. There is provided an epitaxial deposition process characterized by low-level cooling periods which minimize temperature changes between deposition cycles and inter-cycle cleaning so that each new wafer is presented with a substantially equivalent deposition environment.


Find Patent Forward Citations

Goodwin, Dennis. (1989). Process for epitaxial deposition of silicon (U.S. Patent No. 4874464). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4874464

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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