The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 27, 1988

Filed:

Jan. 07, 1988
Applicant:
Inventors:

Been-Jon Woo, Saratoga, CA (US);

Wei-Jen Lo, Cupertino, CA (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L / ;
U.S. Cl.
CPC ...
437 41 ; 437 43 ; 437238 ; 437239 ; 437200 ; 437161 ; 437193 ; 148D / ;
Abstract

A tungsten silicide reoxidation technique for forming a reoxidation layer in a CMOS MOSFET device. After forming an insulated gate member, which has a tungsten silicide layer overlying a polysilicon layer, a CVD oxide layer is deposited on the exposed and crystallized tungsten silicide layer to function as a cap prior to the formation of the reoxidation layer. The CVD oxide layer operates to slow the passage of oxygen atoms to combine with the tungsten atoms of the silicide layer but allows free migration of silicon atoms from the polysilicon layer to the tungsten silicide surface and combine with the oxygen atoms in forming a substantially planarized and uncontaminated reoxidation layer without the requirement of a substantially pure nitrogen ambient.


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