The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 01, 1986

Filed:

Jan. 18, 1985
Applicant:
Inventors:

Tomoshige Hori, Sayama, JP;

Masatoshi Kako, Sayama, JP;

Hiromichi Hayashi, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ;
U.S. Cl.
CPC ...
73 54 ; 374 43 ;
Abstract

Disclosed is a method for measuring changes in a physical property of a liquid or semisolid material which comprises placing a thin metal wire in the material; passing an electric current through the thin metal wire in such a way that the temperature difference between the material and the thin metal wire is kept constant; measuring the intensity of the electric current; and calculating the heat transfer coefficient at the surface of the thin metal wire on the basis of the measured intensity of the electric current and thereby detecting changes in a physical property of the material. This method makes it possible to detect, for example, changes in the coefficient of kinematic viscosity of a food having the form of a gel or changes in the condition of thrombus formation in a blood vessel.


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